By applying Q-control, delicate and highly sensitive surface structures observable with a standard SPM can be characterized with high resolution. The main module of the product connects to the NanoScope Extender Electronics Module and the AFM via an additional cable. A separate remote control operates the module at resonant frequencies of the cantilever from 95 to 550kHz. The product is only available for use with NanoScope systems equipped with Extender capabilities.
Asylum Research, 601 C Pine Street, Santa Barbara, CA 93117. Tel: 805-692-2800; Fax: 805-692-9222.